All Faculty and Research Staff Publications

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1990
Hamers RJ, Markert K. ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES. Physical Review Letters. 1990 ;64:1051-1054.
Hamers RJ, Kohler UK, Demuth JE. EPITAXIAL-GROWTH OF SILICON ON SI(001) BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:195-200.
Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. FINITE-TEMPERATURE PHASE-DIAGRAM OF VICINAL SI(100) SURFACES. Physical Review Letters. 1990 ;64:2406-2409.
Hashizume T, Hamers RJ, Demuth JE, Markert K, Sakurai T. INITIAL-STAGE DEPOSITION OF AG ON THE SI(100)2X1 SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:249-250.
Demuth JE, Koehler U, Hamers RJ. Surface Diffractometry and Lattice Imaging of Scanning Tunneling Microscopy Images. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:214-217.
Hamers RJ, Markert K. SURFACE PHOTOVOLTAGE ON SI(111)-(7X7) PROBED BY OPTICALLY PUMPED SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:3524-3530.
Frenken JWM, Hamers RJ, Demuth JE. Thermal Roughening Studied by Scanning Tunneling Microscopy. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:293-296.
Hamers RJ, Cahill DG. Ultrafast Time Resolution in Scanned Probe Microscopies. Applied Physics Letters. 1990 ;57:2031-2033.
1988
Hamers RJ, Demuth JE. ATOMIC-STRUCTURE AND BONDING OF SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3)AL. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988 ;6:512-516.
Hamers RJ. Characterization of Localized Atomic Surface-Defects by Tunneling Microscopy and Spectroscopy. Journal of Vacuum Science & Technology B. 1988 ;6:1462-1467.
Hamers RJ, Houston PL, Merrill RP. COMPETITION BETWEEN DIRECT-INELASTIC AND TRAPPING DESORPTION CHANNELS IN THE SCATTERING OF NO (V=O,J) FROM IR(111). Journal of Chemical Physics. 1988 ;88:6548-6555.
Hamers RJ, Demuth JE. Electronic-Structure of Localized Si Dangling-Bond Defects by Tunneling Spectroscopy. Physical Review Letters. 1988 ;60:2527-2530.
Demuth JE, Vonlenen EJ, Tromp RM, Hamers RJ. LOCAL ELECTRONIC-STRUCTURE AND SURFACE GEOMETRY OF AG ON SI(111). Journal of Vacuum Science & Technology B. 1988 ;6:18-26.
Hamers RJ, Koch RH, Demuth JE. Scanning Tunneling Microscopy - an Atomic-Scale Probe of Surface Geometry and Electronic-Structure. Journal of the Electrochemical Society. 1988 ;135:C136-C136.
Hamers RJ, Avouris P, Bozso F. A SCANNING TUNNELING MICROSCOPY STUDY OF THE REACTION OF SI(001)-(2X1) WITH NH3. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988 ;6:508-511.
Demuth JE, Koehler U, Hamers RJ. The Stm Learning-Curve and Where It May Take Us. Journal of Microscopy-Oxford. 1988 ;152:299-316.
Kohler UK, Demuth JE, Hamers RJ. SURFACE RECONSTRUCTION AND THE NUCLEATION OF PALLADIUM SILICIDE ON SI(111). Physical Review Letters. 1988 ;60:2499-2502.
Schneir J, Sonnenfeld R, Marti O, Hansma PK, Demuth JE, Hamers RJ. Tunneling Microscopy, Lithography, and Surface-Diffusion on an Easily Prepared, Atomically Flat Gold Surface. Journal of Applied Physics. 1988 ;63:717-721.
1982
Hamers RJ, Wietfeldt JR, Wright JC. DEFECT CHEMISTRY IN CAF2-EU3+. Journal of Chemical Physics. 1982 ;77:683-692.

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