GaN films studied by near-field scanning optical microscopy, atomic force microscopy and high resolution X-ray diffraction

TitleGaN films studied by near-field scanning optical microscopy, atomic force microscopy and high resolution X-ray diffraction
Publication TypeJournal Article
Year of Publication1997
AuthorsLiu, JT, Zhi, D, Redwing, JM, Tischler, MA, Kuech, TF
JournalJournal of Crystal Growth
Volume170
Pagination357-361
Date PublishedJan
DOI10.1016/s0022-0248(96)00588-x