Epitaxy of Al films on GaN studied by reflection high-energy electron diffraction and atomic force microscopy

TitleEpitaxy of Al films on GaN studied by reflection high-energy electron diffraction and atomic force microscopy
Publication TypeJournal Article
Year of Publication1997
AuthorsLiu, QZ, Shen, L, Smith, KV, Tu, CW, Yu, ET, Lau, SS, Perkins, NR, Kuech, TF
JournalApplied Physics Letters
Volume70
Pagination990-992
Date PublishedFeb
DOI10.1063/1.118458