Atom probe tomography evidence for uniform incorporation of Bi across the growth front in GaAs1-xBix/GaAs superlattice

TitleAtom probe tomography evidence for uniform incorporation of Bi across the growth front in GaAs1-xBix/GaAs superlattice
Publication TypeJournal Article
Year of Publication2016
AuthorsChen, WX, Ronsheim, PA, Wood, AW, Forghani, K, Guan, YX, Kuech, TF, Babcock, SE
JournalJournal of Crystal Growth
Volume446
Pagination27-32
Date PublishedJul
DOI10.1016/j.crysgro.2016.04.031